The constant financial pressures on semiconductor manufacturers has created a need to drive down the cost of test by considering higher and higher multi-site testing. Popular handler technologies present a site-count barrier to the number of sites that can be economically deployed. This has caused companies to rethink their strategies a bit by taking another look at strip test.
http://blog.xcerra.com/wp-content/uploads/2015/07/powerdevicechip-resized-600.png 200 200 Rich Yerganian http://blog.xcerra.com/wp-content/uploads/2015/08/logo-xcerra1.png Rich Yerganian2012-01-20 07:40:512016-02-15 14:47:14Strip Test. A growing trend?