Happy New Year!
Just before the holidays the EDN web site published an article in their “Test & Measurement Design Center” jointly authored between Analog Devices and LTXC engineers on how to gain better insight into the performance of high performance ADCs.
The article was coauthored by Maithil Pachchigar of ADI and Rich Liggiero. Maithil is an applications engineer in Analog Devices’ Precision Converters business unit in Wilmington, MA. He joined ADI in 2010 and supports the precision ADC product portfolio and customers in the industrial, instrumentation, medical, and energy segments. Having worked in the semiconductor industry since 2005, Maithil has published numerous technical articles. He received an MSEE degree from San Jose State University in 2006 and an MBA degree from Silicon Valley University in 2010.
Rich is a chief engineer at LTX-Credence. Joining LTX-Credence in June of 2006, he has led the mixed signal test applications team in developing next generation test methods and test techniques. He is a Participating member of IEEE TC-10 standards committee for ADC/DAC specification, Tau Beta Pi & Etta Kappa Nu. He has a master’s degree from Northeastern University and holds two patents. Over 20 years of experience in the semiconductor industry, he continues to focus LTX-Credence innovative technology in ultra-precision analog measurement and signaling technology to new markets.
The ADC toolset developed by Rich allowed Maithil to gain insight into the performance of the AD7960 a 5Msps, 18 bit SAR ADC.
To learn more about the toolset, and how it was applied, read the entire article here:
To learn more about LTXC data converter testing capabilities check out the following web page: