blog posts related to probes or connectors

POGO® Spring Probe Considerations for PCB In-Circuit and Functional Test

How do I select the optimum POGO® spring probe for my PCB test application?
PCB test fixture designers have many factors to consider when selecting the proper spring probe for their application. In the world of spring probes, choices and trade-offs abound when it comes to selecting tip geometry, spring force, probe base material and plating.  Choosing the right combination of options greatly impacts test yields, probe life and cleaning frequency. Read more

Connector Design Considerations for the Demanding Medical Market

Challenging environmental conditions and high reliability requirements create the need for can’t fail connectors.   This article explores some of the more critical design factors that go into designing a new connector for the medical market.

The medical industry requires connectors to reliably operate in a variety of harsh environments.  This drives the connector design to be custom, specifically addressing each application’s unique challenges.  There are many attributes that must be considered when laying out a connector’s specifications, but they typically fall into 1 of 3 categories: material selection, mechanical properties and electrical specifications.   All 3 categories must be considered concurrently to yield a successful connector design. Read more

Flat Probe Technology for RF Test

Today the semiconductor test market is very competitive. This is especially true in the consumable contactor market.
Low operating costs and low average selling prices create low barriers to entry. Micro-organizations plants themselves next to their sole customer and provides fast turn times at competitive prices and onsite support. Although this is acceptable for some it is a risky business model. Furthermore the depth of knowledge of the product and therefore the value add from these micro-organizations is limited.

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Choosing the Right Spring Probe for ICT and FCT Testing

How do I select base material /plating , spring force, and tip selection? In the world of spring probes, choices abound when it comes to selecting materials and platings for plungers, barrels and springs. Choosing the right options can greatly impact yield, probe life and cleaning frequency.

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RF requirements and spring probe development for semiconductor test

High bandwidth,  low inductance signal paths are essential for testing next generation RF  devices.    A successful test strategy must start with  consideration of  contact technology  used to interface the device lead.   Spring probes are the technology of choice for most applications when considerations also include mechanical reliability.  The ZIP flat probe technology from Everett Charles Technologies will provide the case study for the article.

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